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CCVIS-AX
Chip Component Video Inspecting System
CCVIS-A4 is a highly sophisticated automatic visual inspection system for chip components.
Our system employs color cameras and lighting at different incident angles and colors to simultaneously capture image data with multiple characteristics, enabling enhanced defect detection ratio without degrading the yield.
Processing capacity is not affected by the image pickup process since only a single shot is needed for judgment.

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Inspection Systems		 Tablet High-End Tablet Low-End Capsule Granule
Vial Rubber Stopper Chip Area Sensor Non-vibratory
parts feeder		      

     Inspection functions
       Applicable chips Multi-layer ceramic capacitors, tantalum capacitors,
alley chips, chip resistors, ceramic oscillators,
film capacitors, chip LED, chip coils, etc.
       Resolution MAX 2.0/pixel
       Chip size 0402 to 7635(mm)
       Inspected items Crack, chips, foreign particle, scratch, chip size, discoloration, etc.
* For Multi-layer ceramic capacitors
       Inspected surfaces MAX 6 surfaces (face, back, and four sides)
       Processing capacity MAX 4,000 pcs/min.

     Features of the System
       Unprecedented high speed
       and safe inspection 		Our unique flow control and transport mechanism, which eliminates the need for a vibratory feeder, imposes no loading on chip components, hence there is no damage.
Chip components are handled without being forcibly grasped or transferred between holding devices, so chip components never clog up during transport.
Continuous operation for extended periods of time is readily attainable, and partly-finished products without electrodes, or vulnerable products, can be transported without damage.
       Easy Changeover Changeover parts may be exchanged without the use of any tools.
Since changeover times are minimized, this system is ideal for small-lot, multiple-type processing scenarios.
       Easy Parameter Setting

Image captured in the respective inspection areas can be stored.
A simulation function can then be applied to the stored images so changes in defect detection ratio and yield as a function of parameter changes can be easily explored, to fine-tune optimum inspection conditions.
       Quality Control Data

Inspection results, such as the number of defective chips for a given factor, and defect ratios, can be saved.
Specialized software for transferring data to a host computer can be provided. The CCVIS-A4 system is a highly reliable, highly accurate product, based on advanced technology with the validation* quality and the quality of the product is guaranteed by our design, manufacture, inspection and control technologies.

*Validation:The CCVIS-A4 system's reliability depends on validation, the process of confirming and recording the proper operation of the entire system, in order to achieve the role of VISWILL Chip Component Visual Inspection System (CCVIS-A4) .
       Individual Rejection of
       Defective Components		 Defective components can be rejected and separated into two categories.
Rejection of individual parts can be conducted according to defective item and inspection area.
       Automatic
       Illumination
       Adjustment 		Our automatic illumination adjustment technology eliminates the need for luminance control by the operator, and stabilizes the inspection conditions (with selectable adjustments).

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