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| Exhibition | 27th ELECTROTEST JAPAN |
| Venue | Tokyo Big Sight, Japan |
| Term | January 20-22,2010 10:00 - 18:00（10:00 – 17:00 on Jan. 22） |
| Booth number | EAST 4 51 –16 |
| Products exhibited | |
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Thenext model of the CCVIS which inspects with high speed and high accurate will be exhibited in this show. We look forward to seeing you at our booth in the show. |
| Appearance Inspection System |
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| Top Page | Access Map | |||
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